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2012 May June 2013 Jul 2014
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Symposium on Advanced Surface Analysis: Unique Surface Characterization Tools
Sym­po­sium on Advanced Sur­face Analy­sis: Unique Sur­face Char­ac­ter­i­za­tion Tools
Jun 20 all-day
Tick­ets
High Sen­si­tiv­i­ty — Low Ener­gy Ion Scat­ter­ing (HS-LEI S) [Ion-TOF Qtac 100]   The world’s most sen­si­tive spec­trom­e­ter for iden­ti­fy­ing sur­face atoms (top­most lay­er ~0.3nm), offer­ing a 3,000-fold improve­ment in sen­si­tiv­i­ty over con­ven­tion­al spec­trom­e­ters allow­ing[…]
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2012 May June 2013 Jul 2014